Non-uniform sampling for improved appearance-based models

Pattern Recognition Letters

Volumn 24, Issue 1-3, 2003, Pages 521-535

  Altamirano, Luis Carlo ^a,b   Altamirano, Leopoldo ^c   Alvarado, Matías ^a,d  

^a INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

^b BENEMÉRITA UNIVERSIDAD AUTÓNOMA DE PUEBLA   (Mexico)

^c INSTITUTO NACIONAL DE ASTROFÍSICA   (Mexico)

^d INSTITUTO MEXICANO DEL PETRÓLEO   (Mexico)

Author keywords

Appearance based model; Eigenspaces; Interpolation; Non uniform sampling; Object recognition

Indexed keywords

EIGENVALUES AND EIGENFUNCTIONS; IMAGE ANALYSIS; INTERPOLATION; SAMPLING;

IMAGE ACQUISITION;

OBJECT RECOGNITION;

PATTERN RECOGNITION;

EID: 0347296395     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-8655(02)00274-X     Document Type: Article

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