Dielectric function of biaxially strained silicon layer

Applied Physics Letters

Volumn 68, Issue 22, 1996, Pages 3153-3155

  Lee, Hosun ^a,b   Jones, E D ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b Kyung Hee University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0347227709     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115808     Document Type: Article

References (15)

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