Grain boundary characters and sliding of [0001] symmetric tilt boundaries in alumina

Materials Research Society Symposium - Proceedings

Volumn 778, Issue , 2003, Pages 85-90

  Matsunaga, Katsuyuki ^a   Nishimura, Hitoshi ^a   Muto, Hiroyuki ^b   Yamamoto, Takahisa ^a   Ikuhara, Yuichi ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b TOYOHASHI UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BONDING; COMPRESSION TESTING; CREEP; CREEP TESTING; CRYSTAL ATOMIC STRUCTURE; CRYSTAL LATTICES; CRYSTAL SYMMETRY; DIFFUSION; GRAIN BOUNDARIES; HIGH TEMPERATURE PROPERTIES; STRAIN RATE; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC ARRANGEMENT; DIFFUSION BONDING TECHNIQUE; SLIDING; SYMMETRIC TILT BOUNDARIES;

ALUMINA;

EID: 0347024572     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-778-u3.16     Document Type: Conference Paper

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