Modeling electromigration-induced stress evolution and drift kinetics with a stress-dependent diffusivity

Journal of Applied Physics

Volumn 88, Issue 6, 2000, Pages 3301-3309

  Chizhik, S A ^a   Matvienko, A A ^a   Sidelnikov, A A ^a   Proost, J ^b,c,d  

^a INSTITUTE OF SOLID STATE CHEMISTRY AND MECHANOCHEMISTRY   (Russian Federation)

^b IMEC   (Belgium)

^c UNIVERSITY OF LEUVEN   (Belgium)

^d HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346976478     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1287760     Document Type: Article

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