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Journal of Applied Physics

Volumn 88, Issue 6, 2000, Pages 3592-3595

Dielectric properties of pulsed-laser deposited SrTiO3 films at microwave frequency ranges

(6) Hong, J P a Kwak, J S a Kim, C O a Park, S J b Sok, J H b Lee, E H b

a Hanyang University (South Korea)

b Samsung Advanced Institute of Technology (SAIT) (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346976455 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1287608 Document Type: Article

Times cited : (2)

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