Effects of submicrometer particulate silica addenda on the adhesion of micrometer-size particles to a polyester-composite substrate

Journal of Adhesion

Volumn 79, Issue 11, 2003, Pages 1041-1066

  Rimai, D S ^a   Alexandrovich, P ^a   Quesnel, D J ^b  

^a EASTMAN KODAK COMPANY   (United States)

^b University of Rochester   (United States)

Author keywords

Adhesion; Asperities; Charge; Particle; Silica; Toner; Van der Waals

Indexed keywords

ADHESION; ATMOSPHERIC HUMIDITY; ATOMIC FORCE MICROSCOPY; CENTRIFUGATION; COMPOSITE MATERIALS; CONCENTRATION (PROCESS); ELECTROSTATICS; FORCE MEASUREMENT; IMAGE QUALITY; PARTICLE SIZE ANALYSIS; POLYESTERS; SUBSTRATES; SURFACE TREATMENT; VAN DER WAALS FORCES;

DETACHMENT FORCES; ELECTROSTATIC INTERACTIONS; ELECTROSTATIC REPULSIONS;

SILICA;

EID: 0346896362     PISSN: 00218464     EISSN: None     Source Type: Journal    
DOI: 10.1080/714906156     Document Type: Article

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