Simulation and sensitivity of linear analog circuits under parameter variations by robust interval analysis

ACM Transactions on Design Automation of Electronic Systems

Volumn 4, Issue 3, 1999, Pages 280-312

  Richard Shi, C J ^a,c   Tian, Michael W ^b,d  

^a UNIVERSITY OF WASHINGTON   (United States)

^b UNIVERSITY OF IOWA   (United States)

^c University of Washington   (United States)

^d University of Iowa   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346746790     PISSN: 10844309     EISSN: None     Source Type: Journal    
DOI: 10.1145/315773.315780     Document Type: Article

References (24)

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