Rapid frequency-domain analog fault simulation under parameter tolerances

Proceedings - Design Automation Conference

Volumn , Issue , 1997, Pages 275-280

  Tian, Michael W ^a   Shi, C J Richard ^a  

^a UNIVERSITY OF IOWA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; FAILURE ANALYSIS; FREQUENCY DOMAIN ANALYSIS; LINEAR INTEGRATED CIRCUITS; MATHEMATICAL MODELS; MONTE CARLO METHODS; RANDOM PROCESSES; SENSITIVITY ANALYSIS;

LINEAR ANALOG CIRCUITS; RAPID FAULT SIMULATION TECHNIQUES;

COMPUTER SIMULATION;

EID: 0030712734     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/266021.266094     Document Type: Conference Paper

References (27)