Interdiffusion in NiMnSb/V/NiMnSb: X-ray and neutron reflectivity investigation of ion beam sputtered tri layer systems

Journal of Applied Physics

Volumn 86, Issue 9, 1999, Pages 5146-5151

  Schlomka, J P ^a   Tolan, M ^a   Press, W ^a   Fitzsimmons, M R ^b   Siebrecht, R ^c   Schubert, D W ^d   Simon, P ^e  

^a UNIVERSITY OF KIEL   (Germany)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c INSTITUT LAUE LANGEVIN   (France)

^d INSTITUTE OF MATERIALS RESEARCH   (Germany)

^e MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346667027     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371491     Document Type: Article

References (38)

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26. For an overview on neutron reflectivity see, e.g., G. P. Felcher, Phys. Rev. B 24, 1595 (1981); J. Penfold and R. K. Thomas, J. Phys.: Condens. Matter 2, 1369 (1990); S. J. Blundell and J. A. C. Bland, Phys. Rev. B 46, 3391 (1992); H. Zabel, Physica B 198, 156 (1994); Ultrathin Magnetic Structures, edited by J. A. C. Bland and B. Heinrich (Springer, Berlin, 1994), Vol. 1.
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31. The parametrized continuous refractive index profile was divided into 1.5 Å thin boxes and the reflectivity as calculated using the Parratt formalism for sharp interfaces ("slicing method") [L. G. Parratt, Phys. Rev. 95, 359 (1954); M. Tolan, X-ray Scattering from Soft Matter Thin Films: Materials Science and Basic Research, Springer Tracts in Modern Physics, Vol. 148 (Springer, Berlin, 1999)].
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