Electronic properties of single-crystal α-Al2O3 films on Ru(0001)

Journal of Physics Condensed Matter

Volumn 15, Issue 47, 2003, Pages 8165-8176

  Nagata, Kazuo ^a   Yamada, Chikashi ^a   Takahashi, Toshio ^b   Murata, Yoshitada ^a  

^a UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC PROPERTIES; ENERGY GAP; FILM GROWTH; INTERFACIAL ENERGY; RUTHENIUM; SINGLE CRYSTALS; SURFACE PHENOMENA; THICKNESS MEASUREMENT; THIN FILMS;

ANGLE RESOLVED ELECTRON ENERGY LOSS SPECTROSCOPY; DEPOLARIZATION SHIFT; NEGATIVE GRADIENT; OVERLAYER PLASMON;

ALUMINA;

EID: 0346361674     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/15/47/019     Document Type: Article

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