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Volumn 221, Issue 1-4, 2004, Pages 231-236

Microstructures of pulsed laser deposited Eu doped Y 2 O 3 luminescent films on Si(0 0 1) substrates

Author keywords

Atomic force microscopy; Growth mechanism; Luminescence; Pulsed laser deposition; X ray diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; DOPING (ADDITIVES); DYNAMIC RANDOM ACCESS STORAGE; EUROPIUM; FIELD EMISSION DISPLAYS; LUMINESCENCE; MICROSTRUCTURE; MIS DEVICES; PULSED LASER DEPOSITION; SILICON; SUBSTRATES; SURFACES; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

EID: 0346318527     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(03)00882-1     Document Type: Article
Times cited : (15)

References (15)
  • 12
    • 0003472812 scopus 로고
    • Addison-Wesley, Reading, MA
    • B.E. Warren, X-ray Diffraction, Addison-Wesley, Reading, MA, 1969, p. 253.
    • (1969) X-ray Diffraction , pp. 253
    • Warren, B.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.