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Volumn 221, Issue 1-4, 2004, Pages 231-236
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Microstructures of pulsed laser deposited Eu doped Y 2 O 3 luminescent films on Si(0 0 1) substrates
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Author keywords
Atomic force microscopy; Growth mechanism; Luminescence; Pulsed laser deposition; X ray diffraction
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTALLIZATION;
DOPING (ADDITIVES);
DYNAMIC RANDOM ACCESS STORAGE;
EUROPIUM;
FIELD EMISSION DISPLAYS;
LUMINESCENCE;
MICROSTRUCTURE;
MIS DEVICES;
PULSED LASER DEPOSITION;
SILICON;
SUBSTRATES;
SURFACES;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
X RAY SCATTERING;
GROWTH MECHANISM;
LUMINESCENT FILMS;
YTTRIUM COMPOUNDS;
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EID: 0346318527
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(03)00882-1 Document Type: Article |
Times cited : (15)
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References (15)
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