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Volumn 3, Issue , 2001, Pages 1575-1581

Environmental aspects of microelectronics

Author keywords

[No Author keywords available]

Indexed keywords

ECONOMIC AND SOCIAL EFFECTS; ENERGY UTILIZATION; ENVIRONMENTAL IMPACT; INTEGRATED CIRCUITS; LEAD; LIFE CYCLE; RAW MATERIALS; TOXIC MATERIALS;

EID: 0346308237     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (11)
  • 1
    • 0346389356 scopus 로고    scopus 로고
    • note
    • Commission of the European communities: Proposal JOT a Directive of the European Parliament on Waste Electrical and Electronic Equipment; Proposal for a Directive of the European Parliament on the restriction of the use of certain hazardous substances in electrical and electronic equipment. Brussels, 9.6.2000
  • 4
    • 0038157370 scopus 로고    scopus 로고
    • Dissertation zur Erlangung des akademischen Grades Doktor der Ingenieurwissenschaften am Fachbereich 12 - Elektrotechnik der Technischen Universität Berlin (Doctoral Thesis)
    • Nissen, N. F.: Entwicklung eines ökologischen Bewertungsmodells zur Beurteilung elektronischer Systeme. Dissertation zur Erlangung des akademischen Grades Doktor der Ingenieurwissenschaften am Fachbereich 12 - Elektrotechnik der Technischen Universität Berlin (Doctoral Thesis), 2001
    • (2001) Entwicklung Eines Ökologischen Bewertungsmodells zur Beurteilung Elektronischer Systeme
    • Nissen, N.F.1
  • 5
    • 0345758275 scopus 로고    scopus 로고
    • Green Electronics: Trends in the US
    • VDE Verlag Berlin, Offenbach, September 11-13
    • Pfahl, R. C.: Green Electronics: Trends in the US. Joint Int. Congr. EGG2000+, VDE Verlag Berlin, Offenbach, September 11-13, 2000
    • (2000) Joint Int. Congr. EGG2000+
    • Pfahl, R.C.1
  • 6
    • 0000504831 scopus 로고    scopus 로고
    • Trend of Lead-free Soldering in Japan - A Report from NEDO Project 1999-2000
    • VDE Verlag Berlin, Offenbach, September 11 - 13
    • Suga, T: Trend of Lead-free Soldering in Japan - a Report from NEDO Project 1999-2000. Joint Int. Congr. EGG2000+, VDE Verlag Berlin, Offenbach, September 11 - 13, 2000
    • (2000) Joint Int. Congr. EGG2000+
    • Suga, T.1
  • 10
    • 0034836073 scopus 로고    scopus 로고
    • Life Cycle Inventory Analysis and Identification of Environmentally Significant Aspects in Semiconductor Manufacturing
    • Denver, U.S.A.
    • Schischke, K.; Stutz, M., Ruelle, J.-P.; Griese, H.; Reichl, H.: Life Cycle Inventory Analysis and Identification of Environmentally Significant Aspects in Semiconductor Manufacturing. Conference Proceedings 2001 IEEE/ISEE, Denver, U.S.A.
    • (2001) Conference Proceedings 2001 IEEE/ISEE
    • Schischke, K.1    Stutz, M.2    Ruelle, J.-P.3    Griese, H.4    Reichl, H.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.