EE-Toolbox - a modular assessment system for the environmental optimization of electronics

IEEE International Symposium on Electronics and the Environment

Volumn , Issue , 2000, Pages 166-171

  Middendorf, A ^a   Nissen, N F ^a   Griese, H ^a   Muller J ^a   Potter H ^a   Reichl, H ^a   Stobbe, I ^a  

^a Fraunhofer Institute Reliability and Microintegration   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ENVIRONMENTAL IMPACT; LIFE CYCLE; OPTIMIZATION; PRODUCT DEVELOPMENT; RESEARCH AND DEVELOPMENT MANAGEMENT;

ELECTRONIC PRODUCTS; LIFE CYCLE ANALYSIS; MODULAR ASSESSMENT SYSTEM;

ELECTRONIC EQUIPMENT;

EID: 0034450116     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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