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Thin Solid Films

Volumn 337, Issue 1-2, 1999, Pages 196-199

Temperature analysis of polysilicon thin-film transistors made by excimer laser crystallization

(3) Foglietti, V a Mariucci, L a Fortunato, G a

a CNR (Italy)

Author keywords

Density of states (DOS) model; Excimer laser crystallization; Kink effect

Indexed keywords

EID: 0346206464 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(98)01379-0 Document Type: Article

Times cited : (5)

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