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Volumn 16, Issue 5, 2003, Pages 665-668

Characterization of SiO2 Surface Treated by HMDS Vapor and O2 Plasma with AFM Tip

Author keywords

Adhesion; AFM; HMDS; Micro machine; Surface energy

Indexed keywords

HEXAMETHYLDISILAZANE; SILANE DERIVATIVE; SILICON DIOXIDE; UNCLASSIFIED DRUG;

EID: 0346158274     PISSN: 09149244     EISSN: None     Source Type: Journal    
DOI: 10.2494/photopolymer.16.665     Document Type: Conference Paper
Times cited : (24)

References (9)
  • 1
    • 0347477130 scopus 로고    scopus 로고
    • Cleaning Technology in Semiconductor Device Manufacturing, 97-35 Paris
    • A. Kawai et.al., Proc. 5th Inter. Symp. Cleaning Technology in Semiconductor Device Manufacturing, 97-35 Paris, (1997) p536-543.
    • (1997) Proc. 5th Inter. Symp. , pp. 536-543
    • Kawai, A.1
  • 9
    • 0004219858 scopus 로고
    • chapter 12, John Wiley & Sons, Inc., New York
    • R. A. Swalin, "Thermodynamics of solids", chapter 12, John Wiley & Sons, Inc., New York (1962).
    • (1962) Thermodynamics of Solids
    • Swalin, R.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.