X-ray diffraction topography observations of the core in Bi 12SiO20 crystals doped with Mn

Materials Science and Engineering: B

Volumn 106, Issue 2, 2004, Pages 148-154

  Milenov, T I ^a   Botev, P A ^a   Rafailov, P M ^a,b   Gospodinov, M M ^a  

^a INSTITUTE OF SOLID STATE PHYSICS   (Bulgaria)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

BSO; Central core; X ray diffraction

Indexed keywords

BISMUTH COMPOUNDS; CRYSTAL DEFECTS; CRYSTAL GROWTH FROM MELT; CRYSTAL IMPURITIES; DOPING (ADDITIVES); PHOTOCHROMISM; RAMAN SPECTROSCOPY; SILICA; SILICON WAFERS; STOICHIOMETRY; X RAY DIFFRACTION ANALYSIS;

PHOTOCHROMIC IMPURITIES; X-RAY DOUBLE-CRYSTAL DIFFRACTION TOPOGRAPHY;

CRYSTAL STRUCTURE;

EID: 0346093838     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2003.09.012     Document Type: Article

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