X-ray diffraction topography investigation of the core in Bi12SiO20 crystals

Materials Research Bulletin

Volumn 37, Issue 9, 2002, Pages 1651-1658

  Milenov, Teodor I ^a   Rafailov, Peter M ^a   Botev, Pavel A ^a   Gospodinov, Marin M ^a  

^a INSTITUTE OF SOLID STATE PHYSICS   (Bulgaria)

Author keywords

A. Oxides; C. X ray diffraction; D. Defects

Indexed keywords

ABSORPTION; CRYSTAL DEFECTS; CRYSTAL IMPURITIES; CRYSTALLINE MATERIALS; SURFACE TOPOGRAPHY; X RAY DIFFRACTION ANALYSIS;

OPTICAL INHOMOGENITIES;

BISMUTH COMPOUNDS;

EID: 0037043633     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(02)00816-4     Document Type: Article

References (21)

1. 20 crystals