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Volumn 706, Issue , 1998, Pages 134-143

Exploration of Chemically Amplified Resist Mechanisms and Performance at Small Linewidths

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EID: 0345985753     PISSN: 00976156     EISSN: None     Source Type: Book Series    
DOI: 10.1021/bk-1998-0706.ch011     Document Type: Article
Times cited : (1)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.