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Volumn 706, Issue , 1998, Pages 134-143
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Exploration of Chemically Amplified Resist Mechanisms and Performance at Small Linewidths
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0345985753
PISSN: 00976156
EISSN: None
Source Type: Book Series
DOI: 10.1021/bk-1998-0706.ch011 Document Type: Article |
Times cited : (1)
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References (8)
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