Optical second harmonic spectroscopy of silicon surfaces, interfaces and nanocrystals

Physica Status Solidi (A) Applied Research

Volumn 188, Issue 4, 2001, Pages 1371-1381

  Downer, M C ^a   Jiang, Y ^a   Lim, D ^a   Mantese, L ^a   Wilson, P T ^a   Mendoza, B S ^b   Gavrilenko, V I ^c  

^a The University of Texas at Austin   (United States)

^b CENTRO DE INVESTIGACIONES EN ÓPTICA   (Mexico)

^c RUDOLPH TECHNOLOGIES INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0345850421     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200112)188:4<1371::AID-PSSA1371>3.0.CO;2-U     Document Type: Article

References (12)

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