On the relation between defect density and dopant concentration in amorphous silicon films

Journal of Non-Crystalline Solids

Volumn 266-269 A, Issue , 2000, Pages 565-568

  Caputo, Domenico ^a   De Cesare, Giampiero ^a   Irrera, Fernanda ^a   Nascetti, Augusto ^a   Palma, Fabrizio ^a  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0345848976     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0022-3093(99)00846-7     Document Type: Article

References (10)

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