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Volumn 65, Issue 632, 1999, Pages 894-900
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Proposal of lap joint type shear specimen for evaluation of creep deformation properties of solder
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Author keywords
Creep; Electronic device; Finite element method; Lap joint type shear specimen; Reliability; Solder joint; Surface mount technology; Thermal stress
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Indexed keywords
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EID: 0345815402
PISSN: 03875008
EISSN: None
Source Type: Journal
DOI: 10.1299/kikaia.65.894 Document Type: Article |
Times cited : (7)
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References (24)
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