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Volumn 366, Issue , 2000, Pages 399-405

Cooling of Thermal Enhanced BGA Package Using Foam Metal Heat Sinks

Author keywords

BGA Package; Electronic Equipment Cooling; Foam Metal Heat Sinks

Indexed keywords


EID: 0345813321     PISSN: 02725673     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (2)

References (13)
  • 3
    • 0029353058 scopus 로고
    • Investigation of Non-Darcian forced convection in an asymmetric heating sintered porous channel
    • G. J. Hwang, C. C. Wu, and C. H. Chao, "Investigation of Non-Darcian forced convection in an asymmetric heating sintered porous channel", 1995, ASME J. Heat Transfer, 117, pp. 725-732.
    • (1995) ASME J. Heat Transfer , vol.117 , pp. 725-732
    • Hwang, G.J.1    Wu, C.C.2    Chao, C.H.3
  • 4
    • 0028427445 scopus 로고    scopus 로고
    • Heat transfer measurement and analysis for sintered porous channels
    • G. J. Hwang, and C. H. Chao, "Heat transfer measurement and analysis for sintered porous channels", ASME J. Heat Transfer, 116, pp. 456-464.
    • ASME J. Heat Transfer , vol.116 , pp. 456-464
    • Hwang, G.J.1    Chao, C.H.2
  • 5
    • 0023964941 scopus 로고
    • Effects of thermal dispersion on forced convection in fibrious media
    • M. L. Hunt, and C. L. Tien, 1988, "Effects of thermal dispersion on forced convection in fibrious media. Int. J. Heat Mass Transfer, 31, pp. 301-309.
    • (1988) Int. J. Heat Mass Transfer , vol.31 , pp. 301-309
    • Hunt, M.L.1    Tien, C.L.2
  • 9
    • 0347106197 scopus 로고    scopus 로고
    • Methodology for the thermal measurement of component packages in single semiconductor devices
    • Methodology for the thermal measurement of component packages in single semiconductor devices. JEDEC standard 51.
    • JEDEC Standard 51
  • 10
    • 0346476009 scopus 로고    scopus 로고
    • Integrated circuit thermal measurement method electrical test method
    • Integrated circuit thermal measurement method electrical test method, JEDEC standard 51-1.
    • JEDEC Standard 51-1
  • 11
    • 0345845152 scopus 로고    scopus 로고
    • Integrated circuit thermal test method for environment conditions in a still air, natural convection
    • Integrated circuit thermal test method for environment conditions in a still air, natural convection. JEDEC standard
    • JEDEC Standard
  • 12
    • 0346476007 scopus 로고    scopus 로고
    • Low effective thermal conductivity test board for leaded surface mount packages
    • Low effective thermal conductivity test board for leaded surface mount packages, JEDEC standard 51-3.
    • JEDEC Standard 51-3
  • 13
    • 0002477246 scopus 로고
    • Describing uncertainties in single sample experiments
    • S. J. Kline and F. A. McClintock, 1953, "Describing uncertainties in single sample experiments", Mech. Eng., 75, pp.3-8.
    • (1953) Mech. Eng. , vol.75 , pp. 3-8
    • Kline, S.J.1    McClintock, F.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.