Ultrathin film of Cu on α-Fe2O3(0001)

Thin Solid Films

Volumn 281-282, Issue 1-2, 1996, Pages 76-79

  Møller, Preben J ^a   Guo, Qinlin ^b   Gui, Linlin ^b  

^a UNIVERSITY OF COPENHAGEN   (Denmark)

^b Peking University   (China)

Author keywords

Copper; Growth; Iron oxide; Surface structure; Thin films

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DEPOSITION; EPITAXIAL GROWTH; EVAPORATION; FILM GROWTH; IRON OXIDES; LOW ENERGY ELECTRON DIFFRACTION; SURFACE STRUCTURE; ULTRATHIN FILMS; ULTRAVIOLET SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

ULTRAHIGH VACUUM; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY; X RAY INDUCED AUGER PARAMETER;

COPPER;

EID: 0345647982     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(96)08579-3     Document Type: Article

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