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Volumn 92, Issue , 1996, Pages 513-518
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XPS, AES and LEED studies of Cu deposited on Cr 2 O 3 (0001) surfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
AGGLOMERATION;
AUGER ELECTRON SPECTROSCOPY;
COPPER;
DEPOSITION;
EPITAXIAL GROWTH;
LOW ENERGY ELECTRON DIFFRACTION;
SURFACE STRUCTURE;
X RAY PHOTOELECTRON SPECTROSCOPY;
CHROMIUM OXIDES;
COPPER IODIE;
OXIDES;
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EID: 0030562344
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/0169-4332(95)00287-1 Document Type: Article |
Times cited : (12)
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References (17)
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