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Volumn 92, Issue , 1996, Pages 513-518

XPS, AES and LEED studies of Cu deposited on Cr 2 O 3 (0001) surfaces

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; AUGER ELECTRON SPECTROSCOPY; COPPER; DEPOSITION; EPITAXIAL GROWTH; LOW ENERGY ELECTRON DIFFRACTION; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0030562344     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(95)00287-1     Document Type: Article
Times cited : (12)

References (17)
  • 2
    • 0039524505 scopus 로고
    • Ed. J. Nowotny Elsevier, Amsterdam
    • P.J. Møller, in: Science of Ceramic Interfaces, Vol. 2, Ed. J. Nowotny (Elsevier, Amsterdam, 1994) p. 473.
    • (1994) Science of Ceramic Interfaces , vol.2 , pp. 473
    • Møller, P.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.