Compact and simple apparatus for measuring direct piezoelectricity

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 9 B, 2003, Pages 6115-6117

  Fukunaga, Mamoru ^a   Uesu, Yoshiaki ^a  

^a WASEDA UNIVERSITY   (Japan)

Author keywords

Ba1 xLaxTi1 xCrx O3; Perovskite; Piezoelectricity; Q F probe

Indexed keywords

BARIUM COMPOUNDS; ELECTRIC CHARGE; ELECTRIC VARIABLES MEASUREMENT; ELECTRODES; PEROVSKITE; PROBES; SPURIOUS SIGNAL NOISE; STRESSES;

DIRECT PIEZOELECTRICITY; INDUCED CHARGE; PIEZOELECTRIC COEFFICIENTS; UNIAXIAL STRESS;

PIEZOELECTRICITY;

EID: 0345603643     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.6115     Document Type: Article

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