Nanoscale self-affine surface smoothing by ion bombardment

Physical Review B - Condensed Matter and Materials Physics

Volumn 68, Issue 3, 2003, Pages 334011-334014

  Goswami, D K ^a   Dev, B N ^a  

^a INSTITUTE OF PHYSICS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ANALYTIC METHOD; ARTICLE; MONTE CARLO METHOD; PARTICLE RADIATION; RADIATION BEAM; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTY;

EID: 0345602050     PISSN: 10980121     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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