Nanostructured chiral surfaces

Nanotechnology

Volumn 10, Issue 3, 1999, Pages 355-361

  Ernst, K H ^a   Bohringer M ^a   McFadden, C F ^a   Hug, P ^a   Muller U ^a   Ellerbeck, U ^b  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

AROMATIC HYDROCARBONS; LOW ENERGY ELECTRON DIFFRACTION; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; VAPOR DEPOSITION;

TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS);

NANOSTRUCTURED MATERIALS;

EID: 0345504851     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/10/3/320     Document Type: Article

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