Round robin of time-of-flight secondary ion mass spectrometry damage studies of a photoimmobilized reagent on diamond surfaces designed for surface glycoengineering

Applied Surface Science

Volumn 144-145, Issue , 1999, Pages 409-413

  Leonard D ^a   Keller, B ^b   Chevolot, Y ^a   Wieland, M ^b,c   Mathieu, H J ^a  

^a EPFL   (Switzerland)

^b SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^c ETH ZURICH   (Switzerland)

Author keywords

DLC; Functionalization; Ion beam damage; Round robin; Time of flight spectrometers; ToF SIMS

Indexed keywords

AMINES; CHEMICAL BONDS; DIAMONDS; ION BEAMS; MOLECULAR DYNAMICS; MOLECULES; NEGATIVE IONS; SPECTROMETERS; SPECTRUM ANALYSIS; SURFACES;

FUNCTIONALIZATION; ION BEAM DAMAGE; PHOTOIMMOBILIZED REAGENT; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TIME OF FLIGHT SPECTROMETERS;

SECONDARY ION MASS SPECTROMETRY;

EID: 0345504738     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00833-2     Document Type: Article

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