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Volumn 165, Issue 1-4, 2003, Pages 73-80

Degradation of a solid state electrochromic device

Author keywords

78.20.Ek; 78.20.Jq; Degradation; Electrical properties; Electrochromic device; Optical properties

Indexed keywords

CYCLIC VOLTAMMETRY; DEGRADATION; ELECTROOPTICAL EFFECTS; EVAPORATION; PHYSICAL VAPOR DEPOSITION;

EID: 0345411989     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2003.08.015     Document Type: Conference Paper
Times cited : (10)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.