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Volumn 165, Issue 1-4, 2003, Pages 73-80
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Degradation of a solid state electrochromic device
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Author keywords
78.20.Ek; 78.20.Jq; Degradation; Electrical properties; Electrochromic device; Optical properties
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Indexed keywords
CYCLIC VOLTAMMETRY;
DEGRADATION;
ELECTROOPTICAL EFFECTS;
EVAPORATION;
PHYSICAL VAPOR DEPOSITION;
ELECTROCHEMICAL CHARACTERIZATIONS;
PLASMA ASSISTED PHYSICAL VAPOR DEPOSITION;
ELECTROCHROMIC DEVICES;
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EID: 0345411989
PISSN: 01672738
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ssi.2003.08.015 Document Type: Conference Paper |
Times cited : (10)
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References (20)
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