Combined use of lattice source interferences and divergent beam X-ray interferences to investigate the microstructure of ion-bombarded Cu-Sn-diffusion zones

Fresenius' Journal of Analytical Chemistry

Volumn 358, Issue 1-2, 1997, Pages 148-153

  Dabritz S ^a   Langer, E ^a   Hauffe, W ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0344922491     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160050368     Document Type: Article

References (15)

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