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Volumn , Issue , 1997, Pages 37-41
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Analysis of electrical test data using a neural network approach
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ALGORITHMS;
NEURAL NETWORKS;
PROCESS CONTROL;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR DEVICE STRUCTURES;
ELECTRICAL TEST DATA;
PROCESS CONTROL MONITORS;
SEMICONDUCTOR DEVICE TESTING;
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EID: 0031368011
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (7)
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