X-ray absorption studies of phase formation in a Ti/TiN coating on cubic boron nitride

Journal of Alloys and Compounds

Volumn 362, Issue 1-2, 2004, Pages 171-177

  Piskorska, E ^a   Lawniczak Jablonska, K ^a   Demchenko, I N ^a   Benko, E ^b,c   Welter, E ^d  

^a INSTITUTE OF PHYSICS   (Poland)

^b Institute of Metal Cutting   (Poland)

^c UNIVERSITY OF BIELSKO BIALA   (Poland)

^d DESY   (Germany)

Author keywords

EXAFS; Synchrotron radiation; Thin films; Vapour deposition; X ray spectroscopy; XANES

Indexed keywords

ANNEALING; CHEMICAL BONDS; CRYSTAL DEFECTS; CUBIC BORON NITRIDE; INCLUSIONS; POWDERS; SYNCHROTRON RADIATION; THIN FILMS; TITANIUM NITRIDE; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAY SPECTROSCOPY; X RAYS;

PHASE FORMATION;

PROTECTIVE COATINGS;

EID: 0345329228     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(03)00580-2     Document Type: Conference Paper

References (27)

1. Seal S., Underwood H., Uda M., Osawa H., Kanai A., Barr T.L., Benko E., Krauss A., Perera R.C.C. J. Vac. Sci. Technol. A. 16:(3):1998.
2. Venezar N.P. ISM USSR, Kiev. 1986.
3. F.P. Bundy, R.H. Wentrof, J. Chem. Phys. 38 (1963) 618, 631. Chem Y.I., Duh J.G. Surf. Coat. Technol. 48:1991;163.
4. F.P. Bundy, R.H. Wentrof, J. Chem. Phys. 38 (1963) 618, 631. Chem Y.I., Duh J.G. Surf. Coat. Technol. 48:1991;163.
5. Solozhenko V.L. Dokl. Phys. Chem. Akad. Nauk SSSR. 301:1988;147.
6. Solozhenko V.L. High Press. Res. 201:1991.
7. Solozhenko V.L. Diamond Relat. Mater. 1:1994.
8. Duh J.G., Doong J.C. Surf. Coat. Technol. 56:1993;257.
9. Hohl F., Stock H.R., Mayr P. Surf. Coat. Technol. 54/55:1992;160.
10. Seal S., Barr T.L., Sobczak N., Benko E. J. Vac. Sci. Technol. A. 15:1997;505-512.
11. Benko E., Barr T.L., Hardcastle S., Hoppe E., Bernasik A., Morgiel J. Ceram. Int. 26:2001;637-643.
12. Benko E., Morgiel J., Czeppe T., Barr T.L. J. Eur. Ceram. Soc. 18:1998;389-393.
13. Benko E., Barr T.L. Fifth International Conference on Composites Engineering, Las Vegas:1998;75-76.
14. Benko E. Diamond Relat. Mater. 6:1997;1192-1197.
15. Benko E., Skrzypek J., Królicka B., Wyczesany A., Barr T.L. Diamond Relat. Mater. 8:1999;1838-1846.
16. Benko E., Wyczesany A., Barr T.L. Ceram. Int. 26:2000;639-644.
17. Holleck H. J. Vac. Sci. Technol. A. 4:1986;2661.
18. K.V. Klementiev, XANES dactyloscope for Windows, freeware: www.desy.de/̃klmn/xanda.html .
19. Lawniczak-Jablonska K., Iwanowski R.J., Demchenko I.V., Boettcher T., Einfeldt S., Hommel D., Cortes R., Perera R.C.C. J. Alloys Comp. 328:2001;77.
20. E. Benko, K. Lawniczak-Jablonska, P. Klimczyk, I.N. Demchenko, E. Piskorska, P. Nachimuthu, R.C.C. Perera, A. Włochowicz, A. Benko, T.L. Barr, Annual Report of Advanced Light Source, 2001.
21. Teo B.K. EXAFS: Basic Principles and Data Analysis. 1986.
22. Teo B.K., Joy D.C. EXAFS Spectroscopy. Techniques and Applications. 1981.
23. Newville M., et al. Phys. Rev. B. 47:(21):1993;14126-14131.
24. Villars P., Calvert L.D. Pearson's Handbook of Crystallographic Data for Intermetallic Phases. Vol. 3:1989.
25. Ravel B. J. Synchrotron Radiat. 8:2001;314-316.
26. Ankudinov A., Ravel B., Rehr J.J., Conradson S.D. Phys. Rev. B. 58:1998;7565.
27. http://cars9.uchicago.edu/ifeffit/.