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Volumn 361, Issue 6-7, 1998, Pages 637-639
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EDX depth profiling by means of effective layers
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0345317577
PISSN: 09370633
EISSN: None
Source Type: Journal
DOI: 10.1007/s002160050975 Document Type: Article |
Times cited : (5)
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References (4)
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