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Volumn 74, Issue 12, 1999, Pages 1683-1685

Scaling laws in annealed LiCoOx films

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; DIFFUSION IN SOLIDS; FILM GROWTH; LITHIUM COMPOUNDS; MORPHOLOGY; SURFACE ROUGHNESS; THIN FILMS;

EID: 0345202295     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123654     Document Type: Article
Times cited : (15)

References (16)
  • 4
    • 0001654529 scopus 로고
    • J. M. Williams and T. P. Beebe, Jr., J. Phys. Chem. 97, 6249 (1993); 97, 6255 (1993).
    • (1993) J. Phys. Chem. , vol.97 , pp. 6255
  • 7
    • 0001128793 scopus 로고
    • S. F. Edwards and D. R. Wilkinson, Proc. R. Soc. London. Ser. A 381, 17 (1982); D. Wolf and J. Villain, Europhys. Lett. 13, 389 (1990).
    • (1990) Europhys. Lett. , vol.13 , pp. 389
    • Wolf, D.1    Villain, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.