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Volumn 74, Issue 12, 1999, Pages 1683-1685
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Scaling laws in annealed LiCoOx films
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
DIFFUSION IN SOLIDS;
FILM GROWTH;
LITHIUM COMPOUNDS;
MORPHOLOGY;
SURFACE ROUGHNESS;
THIN FILMS;
LINEAR RELATIONSHIPS;
SEMICONDUCTING FILMS;
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EID: 0345202295
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.123654 Document Type: Article |
Times cited : (15)
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References (16)
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