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Volumn 423, Issue 2, 1999, Pages

Characterization of the five-fold plane surface of an Al70.4Pd21.4Mn8.2 quasi-crystal by means of surface X-ray diffraction

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL SYMMETRY; MORPHOLOGY; QUASICRYSTALS; SINGLE CRYSTALS; SURFACE ROUGHNESS; SYNCHROTRON RADIATION; THERMODYNAMIC STABILITY; X RAY CRYSTALLOGRAPHY;

EID: 0345103240     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00002-3     Document Type: Article
Times cited : (31)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.