Correlation of relative X-ray photoelectron spectroscopy shake-up intensity with CuO particle size

Langmuir

Volumn 15, Issue 8, 1999, Pages 2806-2808

  Chusuei, C C ^a   Brookshier, M A ^a   Goodman, D W ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRON ENERGY LEVELS; OXIDES; PARTICLE SIZE ANALYSIS; REDUCTION; SOLUTIONS; X RAY PHOTOELECTRON SPECTROSCOPY;

SHAKE UP INTENSITY; SPIN COATING; X RAY EXCITED AUGER ELECTRON SPECTROSCOPY;

NANOSTRUCTURED MATERIALS;

EID: 0345045358     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9815446     Document Type: Article

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