메뉴 건너뛰기




Volumn 125, Issue 1, 2003, Pages 153-156

The effect of cooling rate on the growth of Cu-Sn intermetallics in annealed PBGA solder joints

Author keywords

Cooling rate; Cu Sn intermetallics; Intermetallic compound growth; Plastic BGA; Solder joint

Indexed keywords

AGING OF MATERIALS; ANNEALING; COOLING; COPPER ALLOYS; DIFFUSION; EUTECTICS; GROWTH (MATERIALS); INTERMETALLICS; METALLOGRAPHIC MICROSTRUCTURE; SOLDERED JOINTS; SOLIDIFICATION; THERMAL EFFECTS;

EID: 0344982093     PISSN: 10437398     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1537070     Document Type: Article
Times cited : (6)

References (20)
  • 1
    • 0003816374 scopus 로고
    • Van Nostrand Reinhold, New York, NY
    • Lau, J. H., 1991, Solder Joint Reliability. Van Nostrand Reinhold, New York, NY, pp. 406-449.
    • (1991) Solder Joint Reliability , pp. 406-449
    • Lau, J.H.1
  • 2
    • 0030106421 scopus 로고
    • Effect of solid-state intermetallic growth on the fracture toughness of Cu/63Sn-37Pb solder joints
    • Mar.
    • Pratt, R. E., Stromswold, E. I., and Quesnel, D. J., 1995, "Effect of Solid-State Intermetallic Growth on the Fracture Toughness of Cu/63Sn-37Pb Solder Joints," IEEE Trans. Compon., Packag. Manuf. Technol., Part A, 19, Mar., pp. 134-141.
    • (1995) IEEE Trans. Compon., Packag. Manuf. Technol., Part A , vol.19 , pp. 134-141
    • Pratt, R.E.1    Stromswold, E.I.2    Quesnel, D.J.3
  • 3
    • 0031077284 scopus 로고    scopus 로고
    • Effect of intermetallic compounds on the thermal fatigue of surface mount solder joints
    • Tu, P. L., Chan, Y. C., and Lai, J. K. L., 1997, "Effect of Intermetallic Compounds on the Thermal Fatigue of Surface Mount Solder Joints," IEEE Trans. Compon., Packag. Manuf. Technol., Part B, 20, pp. 87-93.
    • (1997) IEEE Trans. Compon., Packag. Manuf. Technol., Part B , vol.20 , pp. 87-93
    • Tu, P.L.1    Chan, Y.C.2    Lai, J.K.L.3
  • 4
    • 0031145428 scopus 로고    scopus 로고
    • Aging studies of Cu-Sn intermetallic compounds in annealed surface mount solder joints
    • So, A. C. K., Chan, Y. C., and Lai, J. K. L., 1997, "Aging studies of Cu-Sn intermetallic compounds in annealed surface mount solder joints," IEEE Trans. Compon., Packag. Manuf. Technol., Part B, 20, pp. 161-166.
    • (1997) IEEE Trans. Compon., Packag. Manuf. Technol., Part B , vol.20 , pp. 161-166
    • So, A.C.K.1    Chan, Y.C.2    Lai, J.K.L.3
  • 5
    • 0020125253 scopus 로고
    • Kinetics of interfacial reaction in bimetallic Cu-Sn thin films
    • Tu, K. N., and Thompson, R. D., 1982, "Kinetics of interfacial reaction in bimetallic Cu-Sn thin films," Acta Metall., 30, pp. 947-952.
    • (1982) Acta Metall. , vol.30 , pp. 947-952
    • Tu, K.N.1    Thompson, R.D.2
  • 6
    • 0001684178 scopus 로고
    • Microstructure investigation of copper-tin intermetallics and the influence of layer thickness on shear strength
    • Oct.
    • Dirnfeld, S. F., and Ramon, J. J., 1990, "Microstructure investigation of copper-tin intermetallics and the influence of layer thickness on shear strength," Weld. J. (London), Oct., pp. 373-377.
    • (1990) Weld. J. (London) , pp. 373-377
    • Dirnfeld, S.F.1    Ramon, J.J.2
  • 7
    • 51649143798 scopus 로고
    • The growth of Cu-Sn intermetallics at a pretinned copper-solder interface
    • Apr.
    • Sunwoo, A. J., Morris, Jr., J. W., and Lucey, Jr., G. K., 1992, "The growth of Cu-Sn intermetallics at a pretinned copper-solder interface," Metall. Trans. A, 23A, Apr., pp. 1323-1332.
    • (1992) Metall. Trans. A , vol.23 A , pp. 1323-1332
    • Sunwoo, A.J.1    Morris Jr., J.W.2    Lucey Jr., G.K.3
  • 9
    • 0022183097 scopus 로고
    • Isothermal aging characteristics of external lead solder connections
    • Marinis, T. F., and Reinert, R. C., 1985, "Isothermal aging characteristics of external lead solder connections," Proc. 35th ECTC, pp. 73-80.
    • (1985) Proc. 35th ECTC , pp. 73-80
    • Marinis, T.F.1    Reinert, R.C.2
  • 12
    • 51249162222 scopus 로고
    • Analysis of low-temperature intermetallic growth in copper-tin diffusion couples
    • Mar.
    • Mei, Z., Sunwoo, A. J., and Morris, Jr., J. W., 1992, "Analysis of low-temperature intermetallic growth in copper-tin diffusion couples," Metall. Trans. A, 23A, Mar., pp. 857-864.
    • (1992) Metall. Trans. A , vol.23 A , pp. 857-864
    • Mei, Z.1    Sunwoo, A.J.2    Morris Jr., J.W.3
  • 15
    • 0030216469 scopus 로고    scopus 로고
    • Reliability of studies of surface mount solder joints-Effect of Cu-Sn intermetallic compounds
    • So, A. C. K., and Chan, Y. C., 1996, "Reliability of Studies of Surface Mount Solder Joints-Effect of Cu-Sn Intermetallic Compounds," IEEE Trans. Compon., Packag. Manuf. Technol., Part B, 19(3), pp. 661-668.
    • (1996) IEEE Trans. Compon., Packag. Manuf. Technol., Part B , vol.19 , Issue.3 , pp. 661-668
    • So, A.C.K.1    Chan, Y.C.2
  • 16
    • 0008568968 scopus 로고    scopus 로고
    • Fatigue lifetimes of PBGA solder joints reflowed at different conveyor speeds
    • Fan, S. H., Chan, Y. C., and Lai, J. K. L., 2001, "Fatigue Lifetimes of PBGA Solder Joints Reflowed at different Conveyor Speeds," ASME J. Electron. Packag., 123(3), pp. 290-294.
    • (2001) ASME J. Electron. Packag. , vol.123 , Issue.3 , pp. 290-294
    • Fan, S.H.1    Chan, Y.C.2    Lai, J.K.L.3
  • 18
    • 0003831179 scopus 로고
    • London, U.K.: Electro-Chemical Publ., Chap. 4
    • Wassink, R. J. K., 1989, Soldering in Electronics. London, U.K.: Electro-Chemical Publ., Chap. 4, pp. 149-159.
    • (1989) Soldering in Electronics , pp. 149-159
    • Wassink, R.J.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.