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Volumn 108, Issue 1-3, 2003, Pages 86-90

A novel planarization process for polysilicon sacrificial layers in a micro-thermal system

Author keywords

CMP; Planarization process

Indexed keywords

CHEMICAL MECHANICAL POLISHING; DEPOSITION; ETCHING; THERMAL INSULATION; THIN FILM CIRCUITS; THIN FILM TRANSISTORS; THIN FILMS;

EID: 0344945473     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2003.04.002     Document Type: Conference Paper
Times cited : (5)

References (6)
  • 3
    • 0029409490 scopus 로고
    • Modeling of chemical-mechanical polishing: A review
    • G. Nanz, L.E. Camilletti, Modeling of chemical-mechanical polishing: a review, IEEE Trans. Semicond. Manuf. 8 (4) (1995) 382-389.
    • (1995) IEEE Trans. Semicond. Manuf. , vol.8 , Issue.4 , pp. 382-389
    • Nanz, G.1    Camilletti, L.E.2
  • 4
    • 0033293346 scopus 로고    scopus 로고
    • Improved thin-film transistor (TFT) characteristic on chemical-mechanically polished polycrystalline silicon film
    • A.C.K. Chan, M. Chan, P.K. Ko, Improved thin-film transistor (TFT) characteristic on chemical-mechanically polished polycrystalline silicon film, in: The IEEE Electron Devices Meeting, 1999, pp. 38-41.
    • (1999) The IEEE Electron Devices Meeting , pp. 38-41
    • Chan, A.C.K.1    Chan, M.2    Ko, P.K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.