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Volumn 172, Issue 2, 2003, Pages 243-251

Using CBED and crystallographic image processing to evidence a structural distortion in a new family of ionic conductor Sr1-xLa 1+xAl1-xMgxO4 (0≤x≤0.7)

Author keywords

Convergent beam electron diffraction (CBED); Crystallographic image processing (CIP); K2NiF4 type structure; Sr1 xLa1+xAl1 xMgxO 4 solid solution

Indexed keywords

CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; IMAGE PROCESSING; IONIC CONDUCTION; RAMAN SCATTERING; SOLID SOLUTIONS; X RAY POWDER DIFFRACTION;

EID: 0344927748     PISSN: 00224596     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-4596(03)00049-5     Document Type: Article
Times cited : (13)

References (15)
  • 5
    • 85030945034 scopus 로고    scopus 로고
    • A. Magrez, O. Joubert, M. Ganne, L. Brohan, to be published in Solid State Ionics
    • A. Magrez, O. Joubert, M. Ganne, L. Brohan, to be published in Solid State Ionics.
  • 8
    • 85030949731 scopus 로고    scopus 로고
    • T. Roisnel, R. Rodriguez-Carjaval, "FULLPROF", LLB-Saclay LCSIM-Rennes, June 2001
    • T. Roisnel, R. Rodriguez-Carjaval, "FULLPROF", LLB-Saclay LCSIM-Rennes, June 2001.
  • 10
    • 85030953085 scopus 로고    scopus 로고
    • X.D. Zou, Electron crystallography of inorganic structures: theory and practice, Ph.D., Stockholm University, 1995
    • X.D. Zou, Electron crystallography of inorganic structures: theory and practice, Ph.D., Stockholm University, 1995.
  • 12
    • 85030943507 scopus 로고    scopus 로고
    • D.B. Williams, C.B. Carter, Transmission Electron Microscopy, Vol. II, Plenum Press, New York, 1996, pp. 331-334
    • D.B. Williams, C.B. Carter, Transmission Electron Microscopy, Vol. II, Plenum Press, New York, 1996, pp. 331-334.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.