|
Volumn 172, Issue 2, 2003, Pages 243-251
|
Using CBED and crystallographic image processing to evidence a structural distortion in a new family of ionic conductor Sr1-xLa 1+xAl1-xMgxO4 (0≤x≤0.7)
|
Author keywords
Convergent beam electron diffraction (CBED); Crystallographic image processing (CIP); K2NiF4 type structure; Sr1 xLa1+xAl1 xMgxO 4 solid solution
|
Indexed keywords
CRYSTALLOGRAPHY;
ELECTRON DIFFRACTION;
IMAGE PROCESSING;
IONIC CONDUCTION;
RAMAN SCATTERING;
SOLID SOLUTIONS;
X RAY POWDER DIFFRACTION;
CRYSTAL DISTORTION;
STRUCTURE SYMMETRY;
STRONTIUM COMPOUNDS;
ALUMINUM;
CHEMICAL COMPOUND;
ION;
LANTHANUM;
MAGNESIUM;
OXYGEN;
STRONTIUM;
ANALYTIC METHOD;
ARTICLE;
ATOM;
CHEMICAL STRUCTURE;
CONVERGENT BEAM ELECTRON DIFFRACTION;
CRYSTAL;
CRYSTALLOGRAPHY;
ELECTRIC CONDUCTIVITY;
ELECTRON DIFFRACTION;
RAMAN SPECTROMETRY;
SOLID;
X RAY POWDER DIFFRACTION;
|
EID: 0344927748
PISSN: 00224596
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-4596(03)00049-5 Document Type: Article |
Times cited : (13)
|
References (15)
|