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Volumn 36, Issue 6 SUPPL. B, 1997, Pages 4084-4087

High resolution X-ray diffraction and reflectivity studies of vertical and lateral ordering in multiple self-organized InGaAs quantum dots

Author keywords

III V heterostructures; Reciprocal space mapping; Self organized quantum dots; X ray diffraction

Indexed keywords


EID: 0344907240     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.4084     Document Type: Article
Times cited : (4)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.