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Volumn 36, Issue 6 SUPPL. B, 1997, Pages 4084-4087
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High resolution X-ray diffraction and reflectivity studies of vertical and lateral ordering in multiple self-organized InGaAs quantum dots
a a,e a a b b b c c d d |
Author keywords
III V heterostructures; Reciprocal space mapping; Self organized quantum dots; X ray diffraction
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Indexed keywords
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EID: 0344907240
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.36.4084 Document Type: Article |
Times cited : (4)
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References (16)
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