Guided wave thickness measurement with EMATs

Insight: Non-Destructive Testing and Condition Monitoring

Volumn 45, Issue 11, 2003, Pages 735-739

  Luo, Wei ^a   Rose, J L ^a  

^a The Center for Nanotechnology Education and Utilization   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INSPECTION; PIEZOELECTRIC TRANSDUCERS; PLATE METAL; SHEAR WAVES; STAINLESS STEEL; THICKNESS MEASUREMENT;

ELECTROMAGNETIC ACOUSTIC TRANSDUCER; NONCONTACT MEASUREMENT;

ACOUSTIC TRANSDUCERS;

EID: 0344897145     PISSN: 13542575     EISSN: None     Source Type: Journal    
DOI: 10.1784/insi.45.11.735.52961     Document Type: Article

References (17)

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