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Volumn 124, Issue 3, 2002, Pages 273-282

A baseline and vision of ultrasonic guided wave inspection potential

Author keywords

[No Author keywords available]

Indexed keywords

INSPECTION; NONDESTRUCTIVE EXAMINATION; SENSORS; ULTRASONIC WAVES;

EID: 0036700346     PISSN: 00949930     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1491272     Document Type: Article
Times cited : (654)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.