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Volumn 106, Issue 1, 2004, Pages 89-94

Growth and characterization of PbTe films by magnetron sputtering

Author keywords

Epitaxial like film; Magnetron sputtering; PbTe; Si (1 1 1)

Indexed keywords

FABRICATION; FILM GROWTH; GLASS; HIGH RESOLUTION ELECTRON MICROSCOPY; INFRARED DETECTORS; MAGNETRON SPUTTERING; MONOLITHIC INTEGRATED CIRCUITS; SEMICONDUCTING FILMS; SINGLE CRYSTALS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

EID: 0344877364     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2003.09.026     Document Type: Article
Times cited : (34)

References (15)
  • 12
    • 0003495856 scopus 로고    scopus 로고
    • JCPDS-ICDD card numbers 38-1435 and 27-1402, International Center for Diffraction Data, Swarthmore, PA, 1991
    • Powder diffraction file, JCPDS-ICDD card numbers 38-1435 and 27-1402, International Center for Diffraction Data, Swarthmore, PA, 1991.
    • Powder Diffraction File
  • 15
    • 0003940307 scopus 로고
    • Oxford at the Clarendon Press, London
    • D. McLean, Grain Boundaries in Metals, Oxford at the Clarendon Press, London, 1957, p. 206.
    • (1957) Grain Boundaries in Metals , pp. 206
    • McLean, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.