Time-Resolved Second Harmonic Generation Near-Field Scanning Optical Microscopy

ChemPhysChem

Volumn 4, Issue 11, 2003, Pages 1243-1247

  Schaller, Richard D ^a   Johnson, Justin C ^a   Saykally, Richard J ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Nanotechnology; Near field microscopy; Nonlinear optics; Second harmonic generation; Semiconductors; Time resolved spectroscopy

Indexed keywords

HARMONIC ANALYSIS; HARMONIC GENERATION; II-VI SEMICONDUCTORS; LASER SPECTROSCOPY; NANOTECHNOLOGY; NONLINEAR OPTICS; OPTICAL DATA STORAGE; SELENIUM COMPOUNDS; SEMICONDUCTOR MATERIALS; WIDE BAND GAP SEMICONDUCTORS; ZINC SELENIDE;

CARRIER RELAXATION; HIGH RESOLUTION; NEAR FIELD MICROSCOPY; RELAXATION RATES; SHALLOW DEPTHS; SPATIAL RESOLUTION; TIME-RESOLVED SPECTROSCOPY; TWO-PHOTON EXCITATIONS;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

AMPLIFIER; ARTICLE; CHEMICAL PARAMETERS; CHEMICAL REACTION; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; ENERGY TRANSFER; EXCITATION; FLUORESCENCE; MOLECULAR DYNAMICS; MOLECULAR PROBE; NANOTECHNOLOGY; PHOTON; POLARIZATION; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SEMICONDUCTOR; SIGNAL PROCESSING; SPATIAL FREQUENCY DISCRIMINATION;

EID: 0344845105     PISSN: 14394235     EISSN: None     Source Type: Journal    
DOI: 10.1002/cphc.200300907     Document Type: Article

References (35)

1. W. P. Ambrose, P. M. Goodwin, J. C. Martin, R. A. Keller, Science 1994, 265, 364-367.
2. X. S. Xie, R. C. Dunn, Science 1994, 265, 361-364.
3. J. K. Trautman, J. J. Macklin, Chem. Phys. 1996, 205, 221-229.
4. R. X. Bian, R. C. Dunn, X. S. Xie, P. T. Leung, Phys. Rev. Lett. 1995, 75, 4772-4775.
5. J. Levy, V. Nikitin, J. M. Kikkawa, D. D. Awschalom, J. Appl. Phys. 1996, 79, 6095-6100.
6. T. Guenther, C. Lienau, T. Elsaesser, M. Glanemann, V. M. Axt, T. Kuhn, S. Eshlaghi, A. D. Wieck, Phys. Rev. Lett. 2002, 89, 57401-57404.
7. A. H. LaRosa, C. L. Jahncke, H. D. Hallen, Proc. of the SPIE 1995, 2384, 101-108.
8. B. A. Nechay, U. Siegner, M. Achermann, F. Morier-Genoud, A. Schertel, U. Keller, J. Microsc. 1999, 194, 329-334.
9. M. Acherman, B. A. Nechay, U. Siegner, A. Hartmann, D. Oberli, E. Kapon, U. Keller, Appl. Phys. Lett. 2000, 76, 2695-2697.
10. A. A. Mikhailovsky, M. A. Petruska, L. Kuiru, M. I. Stockman, V. I. Klimov, Optics Lett. 2003, 28, 1686-1688.
11. O. Takeuchi, R. Morita, M. Yamashita, H. Shigekawa, Jpn. J. Appl. Phys. Part 1 2002, 41, 4994-4997.
12. 121 A. V. Benderskii, K. B. Eisenthal, J. Phys. Chem. B 2000, 104, 11723-11728.
13. F. Minami, Y. Mitsumori, S. Matsushita, Phys. Stat. Sol. (B) 1997, 202, 775-782.
14. Y. M. Chang, L. Xu, H. W. K. Tom, Phys. Rev. Lett. 1997, 78, 4649-4952.
15. Y. R. Shen, The Principles of Nonlinear Optics. 1984, New York, Wiley.
16. W. J. Peng, H. Wang, K. S. Wong, G. K. L. Wong, QELS 1996, 10, 55-56.
17. H. Wang, K. S. Wong, B. A. Foreman, Z. Y. Yang, G. K. L. Wong, J. Appl. Phys. 1998, 83, 4773-4776.
18. S. Adachi, T. Taguchi, Phys. Rev. B 1991, 43, 9569-9577.
19. J. R. Chelikowsky, M. L. Cohen, Phys. Rev. B 1976, 14, 556-582.
20. M. Mehendale, S. Sivananthan, W. A. Schroeder, Appl. Phys. Lett. 1997, 71, 1089-1091.
21. R. D. Schaller, J. C. Johnson, K. R. Wilson, L. F. Lee, L. H. Haber, R. J. Saykally, J. Phys. Chem. B 2002, 106, 5143-5154.
22. R. D. Schaller, C. Roth, D. H. Raulet, R. J. Saykally, J. Phys. Chem. B 2000, 104, 5217-5220.
23. R. D. Schaller, R. J. Saykally, Langmuir 2001, 17, 2055-2058.
24. J. C. Johnson, H. Yan, R. D. Schaller, P. B. Petersen, P. Yang, R. J. Saykally, Nanolett. 2002, 2, 279-283.
25. R. D. Schaller, R. J. Saykally, Y. R. Shen, F. Lagugné-Labarthet, Optics Lett. 2003, 28, 1296-1298.
26. P. Hoffmann, B. Dutoit, R. P. Salathe, Ultramicroscopy 1995, 61, 165-170.
27. I. I. Smolyaninov, A. V. Zayats, C. C. Davis, Phys. Rev. B 1997, 56, 9290-9293.
28. C. Yamada, T. Kimura, Phys. Rev. B 1994, 49, 14372-14381.
29. The depth of field (DOF) for the two-photon excited, far-field TRSHG experiments will be dictated by the coherence length over which SHG is produced in the non-phase-matchable material and, to a lesser extent, by the sample polycrystallinity. We estimate this DOF to be ≈ 1 μm. This is in comparison to the 100 nm DOF that is realized in the corresponding one-photon excited experiments, for which the DOF is limited by the penetration depth of the pump beam into the sample.
30. S. K. Kurtz, T. T. Perry, J. Appl. Phys. 1968, 39, 3798-3813.
31. 2 NSOM fiber probe to luminesce over a broad spectral range. Two-photon sample excitation, however, did not cause this problem.
32. C. L. Guo, G. Rodriguez, M. Hoffbauer, A. J. Taylor, Appl. Phys. Lett. 2001, 78, 3211-3213.
33. R. Braun, B. D. Casson, C. D. Bain, E. W. M. van der Ham, Q. H. F. Vrehen, E. R. Eliel, A. M. Briggs, P. B. Davies, J. Chem. Phys. 1999, 110, 4634-4640.
34. T. Kawai, D. J. Neivandt, P. B. Davies, J. Am. Chem. Soc. 2000, 122, 12031-12032.
35. R. C. Dunn, Chem. Rev. 1999, 99, 2891-2927.