Genetic similarities among winter wheat cultivars determined on the basis of RFLPs, AFLPs, and SSRs and their use for predicting progeny variance

Crop Science

Volumn 39, Issue 1, 1999, Pages 228-237

  Bohn, Martin ^a   Utz, H Friedrich ^a   Melchinger, Albrecht E ^a  

^a UNIVERSITY OF HOHENHEIM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIED FRAGMENT LENGTH POLYMORPHISM; CLUSTER ANALYSIS; CULTIVAR; DNA FINGERPRINTING; GENETIC CROSS; GENETIC DIVERSITY; GENETIC MARKER; GENETIC TRAIT; GENETIC VARIANCE; PLANT BREEDING; PLANT GENETICS; PRIMER DNA; RESTRICTION FRAGMENT LENGTH POLYMORPHISM; SIMPLE SEQUENCE REPEAT;

TRITICUM AESTIVUM;

EID: 0344718452     PISSN: 0011183X     EISSN: None     Source Type: Journal    
DOI: 10.2135/cropsci1999.0011183X003900010035x     Document Type: Article

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