UHV STM/STS and ab initio investigation of covellite {001} surfaces

Surface Science

Volumn 423, Issue 2, 1999, Pages 364-374

  Rosso, K M ^a   Hochella Jr , M F ^a  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CHEMICAL BONDS; COMPUTATIONAL METHODS; CRYSTAL ORIENTATION; ELECTRONIC DENSITY OF STATES; ELECTRONIC STRUCTURE; ENERGY GAP; LATTICE CONSTANTS; LOW ENERGY ELECTRON DIFFRACTION; PHOTOELECTRON SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE;

COPPER SULFIDE; COVELLITE; SCANNING TUNNELING SPECTROSCOPY (STS); ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY (UPS);

COPPER COMPOUNDS;

EID: 0344672401     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00941-8     Document Type: Article

References (37)

1. Goble R.J. Can. Min. 23:1985;61.
2. Meissner W. Z. Phys. 58:1929;570.
3. Shuey R.T. Semiconducting Ore Minerals. 1975;Elsevier Science, Amsterdam.
4. Fjellvåg H., Grøvold F., Stølen S., Andersen A.F., Müller-Käfer R., Simon A. Z. Kris. 184:1988;111.
5. Buckel W., Hilsch R. Z. Phys. 128:1950;324.
6. Narbutt K.I. Izv. Akad. Nauk SSSR Ser. Fiz. 38:1974;104.
7. Nemnonov S.A., Mikhailova S.S. Izv. Akad. Nauk. SSSR Ser. Fiz. 38:1974;56.
8. Sugiura C., Gohshi Y., Suzuki I. Phys. Rev. B. 10:1974;338.
9. Domashevskaya E.P., Terekhov V.A., Marshakova L.N., Ugai Ya.A., Nefedov V.I., Sergushin N.P. J. Electron Spectrosc. Relat. Phenom. 9:1976;261.
10. Nakai I., Sugitani Y., Nagashima K., Niwa Y. J. Inorg. Nucl. Chem. 40:1978;789.
11. Tossell J.A. Phys. Chem. Min. 2:1978;225.
12. Folmer J.C.W., Jellinek F. J. Less Common Met. 76:1980;153.
13. Vaughan D.J., Tossell J.A. Can. Min. 16:1980;157.
14. Liang W., Whangbo M.-H. Solid State Commun. 85:1993;405.
15. Li D., Bancroft G.M., Kasrai M., Fleet M.E., Feng X.H., Yang B.X., Tan K.H. Phys. Chem. Min. 21:1994;317.
16. Guilbert J.M., Park C.F. The Geology of Ore Deposits. 1986;Freeman, New York.
17. Higgins S.R., Hamers R.J. J. Vac. Sci. Technol. B. 14:1996;1360.
18. Frenzel G. Neues Jahrb. Mineral Abh. 93:1959;87.
19. Hamers R., Tromp R., Demuth J. Surf. Sci. 181:1987;346.
20. Dovesi R., Saunders V.R., Roetti C., Causà M., Harrison N.M., Orlando R., Aprà E. CRYSTAL95 User's Manual. 1996;University of Torino, Torino.
21. Gatti C. TOPOND96 User's Manual. 1997;CNR-CSRSRC, Milan.
22. Evans H.T., Konnert J.A. Am. Min. 61:1976;996.
23. Towler M.D., Dovesi R., Saunders V.R. Phys. Rev. B. 52:1995;10150.
24. Lichanot A., Aprà E., Dovesi R. Phys. Stat. Sol. B. 177:1993;157.
25. Oftedal I. Z. Kris. 83:1932;9.
26. Bader R.F.W. Atoms in Molecules: A Quantum Theory. 1990;Oxford Science Publications, Oxford.
27. Hochella M.F. Jr. In mineral-water interface geochemistry. Rev. Min. 23:1990;87.
28. Becker U., Hochella M.F. Jr. Geochim.Cosmochim. Acta. 60:1996;2413.
29. Zangwill A. Physics at Surfaces. 1988;Cambridge University Press, Cambridge.
30. K.M. Rosso, U. Becker, M.F. Hochella Jr., submitted for publication.
31. Junta-Rosso J.L., Hochella M.F. Jr. Geochim. Cosmochim. Acta. 60:1996;305.
32. Hamers R.J. Scanning Tunneling Microscopy and Spectroscopy: Theory, Techniques, and Applications. 1993;VCH, New York.
33. Avouris Ph., Lyo I.W., Bozso F. J. Vac. Sci. Technol. B. 9:1991;424.
34. Chen C.J. Introduction to Scanning Tunneling Microscopy. 1993;Oxford Science Publications, Oxford.
35. Kaiser W.J., Bell L.D., Hecht M.H., Grunthaner F.J. J. Vac. Sci. Technol. A. 6:1988;519.
36. Weimer M., Kramar J., Baldeschwieler J. Phys. Rev. B. 39:1989;5572.
37. Sze S.M. Physics of Semiconductor Devices. 1981;Wiley, New York.