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Volumn 361, Issue 6-7, 1998, Pages 728-732

Investigation of divergent beam X-ray reflex sections especially indication by computer simulation and assignment to the grains in polycrystalline samples

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0344491377     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160051006     Document Type: Article
Times cited : (3)

References (16)
  • 8
    • 0022114960 scopus 로고
    • SEM inc, AMS, O'Hare (ed) Chicago
    • Hejna J (1985) In: SEM inc, AMS, O'Hare (ed) Scanning Electron Microscopy. Chicago, p 1103
    • (1985) Scanning Electron Microscopy , pp. 1103
    • Hejna, J.1
  • 15
    • 0344060182 scopus 로고
    • Addison-Wesley, Princeton University, Bonn, München, 2nd edn
    • Sedgewick R (1995) Algorithmen. Addison-Wesley, Princeton University, Bonn, München, 2nd edn, 399-408
    • (1995) Algorithmen , pp. 399-408
    • Sedgewick, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.