Loss measurements of ER-doped silicon-on-insulator waveguides

Materials Science and Engineering: B

Volumn 105, Issue 1-3, 2003, Pages 79-82

  Gad, M A ^a   Evans Freeman, J H ^a   Cinosi, N ^b   Sarma, J ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b UNIVERSITY OF BATH   (United Kingdom)

Author keywords

Erbium; Losses; Single mode; SOI; Waveguide

Indexed keywords

ANNEALING; ERBIUM; HEAT TREATMENT; LUMINESCENCE; OPTICAL WAVEGUIDES; SEMICONDUCTOR DOPING; SILICON WAFERS;

SINGLE-MODE; WAVEGUIDE LOSSES;

SILICON ON INSULATOR TECHNOLOGY;

EID: 0344444349     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2003.08.020     Document Type: Conference Paper

References (11)

1. Ennen H., Scneider J., Pomrenke G., Axmann A. Appl. Phys. Lett. 943:1983;43.
2. Coffa S., Franzo G., Priolo F., Polman A., Serna R. Phys. Rev. B. 16313:1994;49.
3. Kik P.G., Brongersma M.L., Polman A. Appl. Phys. Phys. Lett. 2325:2000;76.
4. Kik P.G., Polman A. J. Appl. Phys. 1992:2000;88.
5. Kik P.G., Polman A. J. Appl. Phys. 535:2000;91.
6. Schmidtchen J., Splett A., Schuppert B., Petermann K., Burbach G. Electron. Lett. 1486:1991;27.
7. Rickman A.G., Ree G.T., Namavar F. J. Lightwave Technol. 1771:1994;12.
8. Soref R.A., Schmidtchen J., Petermann K. IEEE J. Q. Electron. 1971:1991;27.
9. Fisher U., Zinke T., Kropp J.R., Arndt F., Petermann K. IEEE Photon. Technol. Lett. 8:1996;647.
10. N. Ngo, M. Rosa, D. Sweatman, S. Dimitrijev, H. Harrison, A. Titmarsh, in: Proceedings of the SPIE Conference on Design Fabrication, and Characterization of Photonic Devices, vol. 614, 1999, p. 3896.
11. H. Zappe, Introduction to Semiconductor Integrated Optics, Artech House, 1995.