Optical transition process in AgOx super-resolution near-field structure

Journal of Microscopy

Volumn 209, Issue 3, 2003, Pages 254-260

  Ho, F H ^a   Lin, W Y ^b   Chang, H H ^a   Wang, P ^c   Tsai, Din Ping ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b NATIONAL CHUNG CHENG UNIVERSITY   (Taiwan)

^c UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

AgOx thin film; Nonlinear optics; Optical near field recording; Super resolution near field structure; Z scan

Indexed keywords

NANOCOMPOSITES; NONLINEAR OPTICS; OPTICAL PROPERTIES; OPTICAL PUMPING; PULSE REPETITION RATE; SURFACE PLASMONS; THIN FILMS; YTTRIUM ALUMINUM GARNET; ZINC COMPOUNDS;

AGOX THIN FILM; NEAR FIELDS; NEAR-FIELD RECORDING; OPTICAL DISCS; OPTICAL NEAR FIELD; OPTICAL NEAR-FIELD RECORDING; SUPERRESOLUTION; SUPERRESOLUTION NEAR FIELD STRUCTURE; THIN-FILMS; Z-SCAN;

REFLECTION;

OXYGEN; SILICON DIOXIDE; SILVER; SILVER DERIVATIVE; ZINC DERIVATIVE;

ARTICLE; CHEMICAL ANALYSIS; COMPOSITE MATERIAL; DISSOCIATION; FILM; MOLECULAR INTERACTION; NEODYMIUM LASER; OPTICAL RESOLUTION; PRIORITY JOURNAL; SPECTRAL SENSITIVITY; SURFACE PLASMON RESONANCE;

EID: 0344406885     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2003.01121.x     Document Type: Article

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