-
1
-
-
0024945277
-
RF upset susceptibility of CMOS and low power Schottky D-type flip-flops
-
Denver, CO, May
-
D. J. Kenneally, D. S. Koellen, and S. Epstein, "RF upset susceptibility of CMOS and low power Schottky D-type flip-flops," in Proc. IEEE Int. Symp. Electromagnetic Compatibility, Denver, CO, May 1989, pp. 190-195.
-
(1989)
Proc. IEEE Int. Symp. Electromagnetic Compatibility
, pp. 190-195
-
-
Kenneally, D.J.1
Koellen, D.S.2
Epstein, S.3
-
2
-
-
0031078886
-
EMI effects and timing design for increased reliability in digital systems
-
Feb.
-
J. F. Chappel and S. Zaky, "EMI effects and timing design for increased reliability in digital systems," IEEE Trans. Circuits Syst. I, vol. 44, pp. 130-142, Feb. 1997.
-
(1997)
IEEE Trans. Circuits Syst. I
, vol.44
, pp. 130-142
-
-
Chappel, J.F.1
Zaky, S.2
-
3
-
-
0012251165
-
Effect of component choice on the immunity of digital circuits
-
Rome, Italy, Sept.
-
M. P. Robinson, T. M. Benson, C. Christopoulos, J. Dawson, M. D. Ganley. A. C. Marvin, S. J. Porter, D. W. P. Thomas, and J. D. Turner, "Effect of component choice on the immunity of digital circuits," in Proc. Int. Symp. Electromagnetic Compatibility (ROMA'96), Rome, Italy, Sept. 1996, pp. 233-236.
-
(1996)
Proc. Int. Symp. Electromagnetic Compatibility (ROMA'96)
, pp. 233-236
-
-
Robinson, M.P.1
Benson, T.M.2
Christopoulos, C.3
Dawson, J.4
Ganley, M.D.5
Marvin, A.C.6
Porter, S.J.7
Thomas, D.W.P.8
Turner, J.D.9
-
4
-
-
0029406303
-
On the prediction of digital circuit susceptibility to radiated EMI
-
Nov.
-
J.-J. Laurin and S. G. Zaky, "On the prediction of digital circuit susceptibility to radiated EMI," IEEE Trans. Electromagn. Compat., vol. 37, pp. 528-535, Nov. 1995.
-
(1995)
IEEE Trans. Electromagn. Compat.
, vol.37
, pp. 528-535
-
-
Laurin, J.-J.1
Zaky, S.G.2
-
5
-
-
0344080807
-
Using reinforcement learning methods for effective EMC immunity testing of computerised equipment
-
Rome, Italy, Sept.
-
S. Wendsche and E. Habiger, "Using reinforcement learning methods for effective EMC immunity testing of computerised equipment," in Proc. Int. Symp. Electromagnetic Compatibility (ROMA'96), Rome, Italy, Sept. 1996, pp. 221-226.
-
(1996)
Proc. Int. Symp. Electromagnetic Compatibility (ROMA'96)
, pp. 221-226
-
-
Wendsche, S.1
Habiger, E.2
-
6
-
-
0030701026
-
The dependence of the immunity of digital equipment on the hardware and software structure
-
Beijing, China, May
-
R. Vick and E. Habiger, "The dependence of the immunity of digital equipment on the hardware and software structure," in Proc. Int. Symp. Electromagnetic Compatibility, Beijing, China, May 1997, pp. 383-386.
-
(1997)
Proc. Int. Symp. Electromagnetic Compatibility
, pp. 383-386
-
-
Vick, R.1
Habiger, E.2
-
7
-
-
0028547048
-
Prediction and measurement of EMC radiated immunity problems in interconnected digital systems
-
T. Konefal and A. C. Marvin, "Prediction and measurement of EMC radiated immunity problems in interconnected digital systems," Proc. IEE Sci. Meas. Technol., vol. 141, no. 6, pp. 464-470, 1994.
-
(1994)
Proc. IEE Sci. Meas. Technol.
, vol.141
, Issue.6
, pp. 464-470
-
-
Konefal, T.1
Marvin, A.C.2
-
8
-
-
0030234621
-
UHF inter-modulation product prediction in digital systems using SPICE: The need for nonlinear macromodels
-
_, "UHF inter-modulation product prediction in digital systems using SPICE: the need for nonlinear macromodels," Proc. IEE Sci. Meas. Technol., vol. 143, no. 5, pp. 313-318, 1996.
-
(1996)
Proc. IEE Sci. Meas. Technol.
, vol.143
, Issue.5
, pp. 313-318
-
-
-
9
-
-
0041360521
-
A simple model of EMI-induced timing jitter in digital circuits, its statistical distribution and its effect on circuit performance
-
Aug.
-
M. P. Robinson, K. Kischer, I. D. Flintoft, and A. C. Marvin, "A simple model of EMI-induced timing jitter in digital circuits, its statistical distribution and its effect on circuit performance," IEEE Trans. Electromagn. Compat., vol. 45, pp. 513-519, Aug. 2003.
-
(2003)
IEEE Trans. Electromagn. Compat.
, vol.45
, pp. 513-519
-
-
Robinson, M.P.1
Kischer, K.2
Flintoft, I.D.3
Marvin, A.C.4
|