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Volumn 45, Issue 4, 2003, Pages 576-585

The Re-Emission Spectrum of Digital Hardware Subjected to EMI

Author keywords

Digital circuits; Immunity; Jitter; Radio frequency interference; Re emission spectrum; Timing delay

Indexed keywords

DELAY CIRCUITS; EMISSION SPECTROSCOPY; FAILURE ANALYSIS; JITTER; SIGNAL INTERFERENCE; WAVEFORM ANALYSIS;

EID: 0344395620     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEMC.2003.819058     Document Type: Article
Times cited : (13)

References (9)
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    • (1997) IEEE Trans. Circuits Syst. I , vol.44 , pp. 130-142
    • Chappel, J.F.1    Zaky, S.2
  • 4
    • 0029406303 scopus 로고
    • On the prediction of digital circuit susceptibility to radiated EMI
    • Nov.
    • J.-J. Laurin and S. G. Zaky, "On the prediction of digital circuit susceptibility to radiated EMI," IEEE Trans. Electromagn. Compat., vol. 37, pp. 528-535, Nov. 1995.
    • (1995) IEEE Trans. Electromagn. Compat. , vol.37 , pp. 528-535
    • Laurin, J.-J.1    Zaky, S.G.2
  • 5
    • 0344080807 scopus 로고    scopus 로고
    • Using reinforcement learning methods for effective EMC immunity testing of computerised equipment
    • Rome, Italy, Sept.
    • S. Wendsche and E. Habiger, "Using reinforcement learning methods for effective EMC immunity testing of computerised equipment," in Proc. Int. Symp. Electromagnetic Compatibility (ROMA'96), Rome, Italy, Sept. 1996, pp. 221-226.
    • (1996) Proc. Int. Symp. Electromagnetic Compatibility (ROMA'96) , pp. 221-226
    • Wendsche, S.1    Habiger, E.2
  • 6
    • 0030701026 scopus 로고    scopus 로고
    • The dependence of the immunity of digital equipment on the hardware and software structure
    • Beijing, China, May
    • R. Vick and E. Habiger, "The dependence of the immunity of digital equipment on the hardware and software structure," in Proc. Int. Symp. Electromagnetic Compatibility, Beijing, China, May 1997, pp. 383-386.
    • (1997) Proc. Int. Symp. Electromagnetic Compatibility , pp. 383-386
    • Vick, R.1    Habiger, E.2
  • 7
    • 0028547048 scopus 로고
    • Prediction and measurement of EMC radiated immunity problems in interconnected digital systems
    • T. Konefal and A. C. Marvin, "Prediction and measurement of EMC radiated immunity problems in interconnected digital systems," Proc. IEE Sci. Meas. Technol., vol. 141, no. 6, pp. 464-470, 1994.
    • (1994) Proc. IEE Sci. Meas. Technol. , vol.141 , Issue.6 , pp. 464-470
    • Konefal, T.1    Marvin, A.C.2
  • 8
    • 0030234621 scopus 로고    scopus 로고
    • UHF inter-modulation product prediction in digital systems using SPICE: The need for nonlinear macromodels
    • _, "UHF inter-modulation product prediction in digital systems using SPICE: the need for nonlinear macromodels," Proc. IEE Sci. Meas. Technol., vol. 143, no. 5, pp. 313-318, 1996.
    • (1996) Proc. IEE Sci. Meas. Technol. , vol.143 , Issue.5 , pp. 313-318
  • 9
    • 0041360521 scopus 로고    scopus 로고
    • A simple model of EMI-induced timing jitter in digital circuits, its statistical distribution and its effect on circuit performance
    • Aug.
    • M. P. Robinson, K. Kischer, I. D. Flintoft, and A. C. Marvin, "A simple model of EMI-induced timing jitter in digital circuits, its statistical distribution and its effect on circuit performance," IEEE Trans. Electromagn. Compat., vol. 45, pp. 513-519, Aug. 2003.
    • (2003) IEEE Trans. Electromagn. Compat. , vol.45 , pp. 513-519
    • Robinson, M.P.1    Kischer, K.2    Flintoft, I.D.3    Marvin, A.C.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.